oxygen pressure造句
例句與造句
- The effects are reversible after reduction of oxygen pressure
在降低氧的壓力后影響是可逆的。 - The degree of quenching correlates to the level of oxygen pressure
淬滅度與氧壓力水平相關聯(lián)。 - Study on extraction of indium from oxygen pressure acid leach solution
鋅精礦氧壓酸浸液中銦的提取研究 - Fig2 correlation between deposition oxygen pressure and integrated pl intensity
圖2積分pl強度與沉積氧氣壓力的關系。 - The effect of oxygen pressure on the dielectric properties of pulsed laser deposited la - doped pbtio3 thin film
摻雜鈦酸鉛薄膜介電性能的影響 - It's difficult to find oxygen pressure in a sentence. 用oxygen pressure造句挺難的
- Clinical research on fonzylane and high oxygen pressure in treatment of vascular dementia
高壓氧治療血管性癡呆神經心理學與事件相關電位的研究 - A mechanism of effects of oxygen pressure on microstructure of lanio3 conductive thin film is given
所以,氧分壓在lno薄膜的生長過程中是決定薄膜微結構的關鍵因素。 - Foxy fiber optic oxygen sensors are spectrometer - coupled chemical sensors for full spectral analysis of dissolved and gaseous oxygen pressure
Foxy光纖氧氣傳感器是分光計結合化學的傳感器,用于溶解氧和氣態(tài)氧壓力的光譜分析。 - Foxy fiber optic oxygen sensors are spectrometer - coupled chemical sensors for full spectral analysis of dissolved and gaseous oxygen pressure
Oxy光纖氧氣傳感器是將分光計與化學結合的傳感器,用于溶解氧和氣態(tài)氧壓力的全程光譜分析。 - The oxygen desorption activation energy of ybaacuso7 - x was obtained by different heating rates and the relationship between resistivity of yba2cu3o7 - x and oxygen pressure was measured
用多個升溫速率方法得到了ybco的氧脫附活化能。實驗測量了ybco的電阻率隨氧分壓的變化關系。 - When the thickness increases to upon the critical value , the chemical valence of element ni in the top layers of lno film deposited in the relatively low oxygen pressure is + 3
當氧分壓在臨界值以上時, lno薄膜在整個沉積過程中(膜厚小于30nm )的rheed圖樣是條紋狀,表明層狀方式外延生長的特征。 - Measurement of thick film ' s sensitivity for oxygen in different temperature is also performed . it shows that the sensitivity to oxygen pressure increases with the increase of temperature and reaches a maximum value 62 at 650c
實驗測量了ybco厚膜在不同溫度條件下對氧的檢測靈敏度,發(fā)現(xiàn)ybco厚膜的檢測靈敏度隨著溫度的升高而增大,并且在650達到最大值62 。 - Effects of oxygen pressure on microstructure of lno conductive thin film has been studied by in situ reflection high energy diffraction ( rheed ) and ex situ x - ray photoelectron spectroscopy ( xps ) . in the relatively low oxygen pressure , lno film displays spotty rheed pattern
首先,通過原位高能電子衍射( rheed )及x光電子能譜( xps )研究了氧分壓對lno導電薄膜微結構的影響,并進一步提出了氧分壓對lno薄膜微結構的影響的機理。 - When increasing the oxygen pressure , the rheed pattern changes to streaky one again . this rheed pattern transformation induced by the oxygen pressure is reversible . ex situ xps results indicate that the element ni of lno film deposited in the relatively low oxygen pressure with thickness below the critical value exists in the form as ni2 + , while as ni3 + in the relatively high oxygen pressure
隨著膜厚增加而超過約30nm的臨界厚度時,越來越多的晶格氧會移動到了薄膜表面,此時所提供的氧將使得后續(xù)生長的lno膜層重新形成鈣鈦礦結構,并以層狀方式外延生長。
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